An Oxygen Ion Source for the Secondary Ion Mass Spectrometer

Uv-laser Desorption Ion Source Applied to a Secondary Ion Mass Spectrometer

M. Hilchenbach, T. Lang, K. Hornung, L. Thirkell and C. Briois, Max-Planck-Institut für Sonnensystemforschung, Max-Planckstr. 2, 37191, Katlenburg-Lindau, Germany, Laserzentrum Hannover eV, Hollerithallee 8, 30419 Hannover, Germany, Institut für Strömungsmechanik und Aerodynamik, Fakultät für Luft-und Raumfahrttechnik, Universität der Bundeswehr München, Werner-Heisenberg-Weg 39, 85577 Neubiber...

MEMS ion source for mass spectrometer integrated on a chip

An electrostatic autoresonant ion trap mass spectrometer.

A new method for ion extraction from an anharmonic electrostatic trap is introduced. Anharmonicity is a common feature of electrostatic traps which can be used for small scale spatial confinement of ions, and this feature is also necessary for autoresonant ion extraction. With the aid of ion trajectory simulations, novel autoresonant trap mass spectrometers (ART-MSs) have been designed based on...

New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications.

A simple design for a cesium sputter ion source compatible with vacuum and ion-optical systems as well as with electronics of the commercially available Cameca IMS-4f instrument is reported. This ion source has been tested with the cluster primary ions of Si(n)(-) and Cu(n)(-). Our experiments with surface characterization and depth profiling conducted to date demonstrate improvements of the an...

Modeling Transport of Secondary Ion Fragments into a Mass Spectrometer

The Surrey Ion Beam Centre was awarded the Engineering and Physical Sciences Research Council (EPSRC) grant for “Promoting Cross Disciplinary Research: Engineering and Physical Sciences and Social Sciences” allowing continued research into the characteristics of desorption of secondary ions by the impact of fast primary ions in the ambient pressure at the sub-micron scale. To carry out this res...